发明名称 試料汚染方法
摘要 A sample contamination method according to an embodiment includes spraying a chemical solution containing contaminants into a casing, carrying a semiconductor substrate into the casing filled with the chemical solution by the spraying, leaving the semiconductor substrate in the casing filled with the chemical solution for a predetermined time, and carrying the semiconductor substrate out of the casing after the predetermined time passes.
申请公布号 JP5921093(B2) 申请公布日期 2016.05.24
申请号 JP20110134681 申请日期 2011.06.17
申请人 株式会社東芝;東芝ナノアナリシス株式会社 发明人 山田 裕司;片野 真希子;水野 綾子;上村 絵理;並河 明日香;竹内 史
分类号 H01L21/66;G01N1/00;G01N23/223 主分类号 H01L21/66
代理机构 代理人
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