发明名称 Flash memory cell structure having a high gate-coupling coefficient and a select gate
摘要 A flash memory cell structure comprising a semiconductor substrate having a first transistor and a second transistor formed thereon. The first transistor has a stacked gate and a first source/drain regions, wherein the stacked gate further includes a floating gate and a control gate. The control gate is formed above the floating gate. The second transistor is electrically connected in series with the first transistor. The second transistor functions as a select transistor and includes a gate and a second source/drain regions.
申请公布号 US5852313(A) 申请公布日期 1998.12.22
申请号 US19970967940 申请日期 1997.11.12
申请人 UNITED SEMICONDUCTOR CORP. 发明人 HONG, GARY;WANG, PATRICK;TING, WENCHI
分类号 H01L27/115;(IPC1-7):H01L29/792 主分类号 H01L27/115
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