发明名称 |
Flash memory cell structure having a high gate-coupling coefficient and a select gate |
摘要 |
A flash memory cell structure comprising a semiconductor substrate having a first transistor and a second transistor formed thereon. The first transistor has a stacked gate and a first source/drain regions, wherein the stacked gate further includes a floating gate and a control gate. The control gate is formed above the floating gate. The second transistor is electrically connected in series with the first transistor. The second transistor functions as a select transistor and includes a gate and a second source/drain regions.
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申请公布号 |
US5852313(A) |
申请公布日期 |
1998.12.22 |
申请号 |
US19970967940 |
申请日期 |
1997.11.12 |
申请人 |
UNITED SEMICONDUCTOR CORP. |
发明人 |
HONG, GARY;WANG, PATRICK;TING, WENCHI |
分类号 |
H01L27/115;(IPC1-7):H01L29/792 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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