发明名称 Wafer backside particle removal for track tools
摘要 An apparatus for removing one or more backside particles from a semiconductor substrate. The apparatus includes a substrate support member adapted to support the semiconductor substrate. The substrate has a substrate diameter, a substrate frontside, and a substrate backside. The apparatus also includes a curing ring having an annular shape and a curing ring support member adapted to position the curing ring at a predetermined distance from the backside of the semiconductor substrate, thereby defining a removal region. The apparatus further includes a phase change material dispense system adapted to provide a phase change material to the removal region and an ultraviolet source adapted to irradiate the phase change material.
申请公布号 US2008032491(A1) 申请公布日期 2008.02.07
申请号 US20060501201 申请日期 2006.08.07
申请人 SOKUDO CO., LTD. 发明人 HERCHEN HARALD
分类号 H01L21/322 主分类号 H01L21/322
代理机构 代理人
主权项
地址