Integrated circuit (IC) for reconstructing values of flip-flops connected in a scan-chain by using a joint test action group (JTAG) interface, a method of operating the IC, and devices having the IC

摘要

An integrated circuit (IC) includes an on-chip logic that includes an input terminal, an output terminal, and a plurality of synchronizing circuits connected in a scan-chain; a test data in (TDI) line; a test data out (TDO) line connected to the output terminal; and a test access port (TAP) controller that transmits, to the input terminal, data output from one of a plurality of data sources, the data sources including the TDI line and the output terminal, in response to one or more selection signals.

主权项

1. An integrated circuit (IC), comprising:
an on-chip logic that includes an input terminal, an output terminal, and a plurality of sequentially-connected synchronizing circuits connected in a scan-chain between the input terminal and the output terminal; a test data in (TDI) line; a test data out (TDO) line connected to the output terminal; a test access port (TAP) controller that transmits, to the input terminal, data output from one of a plurality of data sources including the TDI line and the output terminal, in response to one or more selection signals; a programmable memory that stores a control signal; and a mask circuit that controls a connection between the TDO line and a TDO pin based on the control signal output from the programmable memory.