发明名称 |
ANALOG SPECTRUM ANALYZER |
摘要 |
A spectrum analyzer for a signal IRF comprising a plurality of frequencies fi comprises N entities each made up of a structure formed by a stack of magnetic and non-magnetic layers having in at least one of the magnetic layers a magnetic configuration in the shape of a vortex, the excitation modes of the magnetic configuration being suitable for detecting the frequencies contained in an incident signal in real time, each entity having a first lower electrode and a second upper electrode, a voltage-measuring device suitable for measuring an electric voltage showing the presence of a frequency fk in the analyzed signal IRF, the device being connected to the lower electrode and to the upper electrode, a measurement-processing device suitable for determining the value of the frequencies fk in the signal IRF, and a line carrying the signal to be analyzed to each of the entities. |
申请公布号 |
US2016305994(A1) |
申请公布日期 |
2016.10.20 |
申请号 |
US201415101359 |
申请日期 |
2014.12.04 |
申请人 |
THALES ;CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE |
发明人 |
KERMORVANT Julien;BORTOLOTTI Paolo;MARCILHAC Bruno;MAGE Jean-Claude;CROS Vincent |
分类号 |
G01R23/163 |
主分类号 |
G01R23/163 |
代理机构 |
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代理人 |
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主权项 |
1. A spectrum analyzer for a signal IRF comprising a number of frequencies fi, comprising N entities each consisting of a structure formed by a stacking of magnetic and non-magnetic layers having, in at least one of the magnetic layers, a vortex-form magnetic configuration, the excitation modes of the magnetic configuration being adapted to detect in real time the frequencies contained in an incident signal, each entity having a bottom first electrode and a top second electrode, a voltage measurement device adapted for measuring an electrical voltage representative of the presence of a frequency fk in the analyzed signal IRF, the device being linked to the bottom electrode and to the top electrode, a measurement processing device adapted for determining the value of the frequencies fk present in the signal IRF, a line bringing the signal to be analyzed to each of the entities. |
地址 |
Courbevoie FR |