发明名称 Measuring device
摘要 According to an embodiment, a measuring device includes a plurality of scintillators, plurality of receiving elements, and a processor. The scintillators each convert incident radiation into light. The receiving elements each convert scintillation light received by a light receiving surface thereof into an electric signal. The processor acquires a value corresponding to an intensity of the incident radiation based on the electric signal. Each of the scintillators includes an incident surface on which the radiation is incident. The incident surface includes an inclination that has a predetermined angle with respect to the light receiving surface and that is asymmetric with respect to a center of the incident surface. The scintillators are arrayed on a plane including the light receiving surface.
申请公布号 US9529095(B2) 申请公布日期 2016.12.27
申请号 US201514837097 申请日期 2015.08.27
申请人 Kabushiki Kaisha Toshiba 发明人 Kobayashi Mitsuyoshi;Hasegawa Rei
分类号 G01T1/202;G01T1/20 主分类号 G01T1/202
代理机构 Finnegan, Henderson, Farabrow, Garrett & Dunner LLP 代理人 Finnegan, Henderson, Farabrow, Garrett & Dunner LLP
主权项 1. A measuring device comprising: a plurality of scintillators to each convert incident radiation into light; a plurality of receiving elements to each convert scintillation light received by a light receiving surface thereof into an electric signal; and a processor to acquire a value corresponding to an intensity of the incident radiation based on the electric signal, wherein each of the scintillators has an end that is an incident surface and has another end at which the light receiving surface is provided,the incident surface includes an inclination that has a predetermined angle with respect to the light receiving surface and that is asymmetric relative to a direction connecting the incident surface to the light receiving surface, with respect to a center of the incident surface,the plurality of scintillators are arrayed on a plane including the light receiving surface, andanother scintillator having a lower density than that of the plurality of scintillators is arranged on the incident surface.
地址 Tokyo JP
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