发明名称 Delay device, semiconductor testing device, semiconductor device, and oscilloscope
摘要 <p>To enhance the accuracy of the delay time of the delay device by reducing the change in the power supply voltage for the delay device, and a delay device that delays an incoming transmission signal, comprising: a delay element that operates on a power supply voltage Vdd and a power supply voltage Vss and delays the transmission signal, the voltage Vdd being larger than the voltage Vss; an addition circuit that outputs to an output of the delay element, a predetermined voltage that is larger than the voltage Vss and smaller than the voltage Vdd. This delay element includes a digital circuit that outputs one of output voltages of two possible values in correspondence with an input voltage. Furthermore, the addition circuit outputs a voltage substantially similar to a threshold voltage that said output of the digital circuit inverts from one of the output voltages of two possible values to another thereof.</p>
申请公布号 GB2348061(B) 申请公布日期 2001.04.25
申请号 GB20000006166 申请日期 2000.03.14
申请人 * ADVANTEST CORPORATION 发明人 TOSHIYUKI * OKAYASU;MASAKATSU * SUDA
分类号 G01R31/319;H03H11/26;H03K5/00;H03K5/13;H03K5/14;(IPC1-7):H03K5/13;G01R31/317 主分类号 G01R31/319
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