发明名称 |
Delay device, semiconductor testing device, semiconductor device, and oscilloscope |
摘要 |
<p>To enhance the accuracy of the delay time of the delay device by reducing the change in the power supply voltage for the delay device, and a delay device that delays an incoming transmission signal, comprising: a delay element that operates on a power supply voltage Vdd and a power supply voltage Vss and delays the transmission signal, the voltage Vdd being larger than the voltage Vss; an addition circuit that outputs to an output of the delay element, a predetermined voltage that is larger than the voltage Vss and smaller than the voltage Vdd. This delay element includes a digital circuit that outputs one of output voltages of two possible values in correspondence with an input voltage. Furthermore, the addition circuit outputs a voltage substantially similar to a threshold voltage that said output of the digital circuit inverts from one of the output voltages of two possible values to another thereof.</p> |
申请公布号 |
GB2348061(B) |
申请公布日期 |
2001.04.25 |
申请号 |
GB20000006166 |
申请日期 |
2000.03.14 |
申请人 |
* ADVANTEST CORPORATION |
发明人 |
TOSHIYUKI * OKAYASU;MASAKATSU * SUDA |
分类号 |
G01R31/319;H03H11/26;H03K5/00;H03K5/13;H03K5/14;(IPC1-7):H03K5/13;G01R31/317 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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