发明名称 Polishing pad for semiconductor wafer and laminated body for polishing of semiconductor wafer equipped with the same as well as method for polishing of semiconductor wafer
摘要 An objective of the present invention is to provide a polishing pad for a semiconductor wafer and a laminated body for polishing of a semiconductor wafer equipped with the same which can perform optical endpoint detection without lowering the polishing performance as well as methods for polishing of a semiconductor wafer using them. The polishing pad of the present invention comprises a substrate 11 for a polishing pad provided with a through hole penetrating from surface to back, a light transmitting part 12 fitted in the through hole, the light transmitting part comprises a water-insoluble matrix material (1,2-polybutadiene) and a water-soluble particle (beta-cyclodextrin) dispersed in the water-insoluble matrix material, and the water-soluble particle is less than 5% by volume based on 100% by volume of the total amount of the water-insoluble matrix material and the water-soluble particle. In addition, the laminated body for polishing of the present invention comprises a supporting layer on a backside of the polishing pad. These polishing pad and laminated body for polishing can comprise a fixing layer 13 on a backside.
申请公布号 US2006128271(A1) 申请公布日期 2006.06.15
申请号 US20040529742 申请日期 2004.04.23
申请人 JSR CORPORATION 发明人 SHIHO HIROSHI;HOSAKA YUKIO;HASEGAWA KUO;KAWAHASHI NOBUO
分类号 B24B49/00;B24B1/00;B24B7/30;B24B37/04;B24B37/20;B24D7/12;B24D13/14;H01L21/304 主分类号 B24B49/00
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