发明名称 |
Solid-state imaging device and method of manufacturing the same |
摘要 |
A solid-state imaging device includes: a semiconductor substrate; a pixel unit formed on the semiconductor substrate; and a peripheral circuit unit formed on the semiconductor substrate, at a periphery of the pixel unit, in which the pixel unit includes: a photoelectric conversion film which converts incident light into charges; and a floating diffusion which holds the charges, the peripheral circuit unit includes a transistor including a gate electrode and two source and drain diffusion regions, and the two source and drain diffusion regions have a higher impurity concentration than an impurity concentration of the floating diffusion. |
申请公布号 |
US9406722(B2) |
申请公布日期 |
2016.08.02 |
申请号 |
US201414554027 |
申请日期 |
2014.11.25 |
申请人 |
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. |
发明人 |
Moriyama Yoshiya;Fujimoto Hiromasa;Saeki Kosaku;Takahashi Nobuyoshi |
分类号 |
H01L29/08;H01L51/00;H01L27/30;H01L27/146;H01L21/265;H01L29/423;H01L21/324 |
主分类号 |
H01L29/08 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A solid-state imaging device comprising:
a semiconductor substrate; a pixel; and a peripheral circuit at a periphery of the pixel, wherein the pixel includes:
a photoelectric conversion film which converts incident light into charges; anda floating diffusion, in the semiconductor substrate, for holding the charges,a non-metal contact plug connected with the floating diffusion,a line connected with the non-metal contact plug, the floating diffusion and the photoelectric conversion film being connected to each other via the non-metal contact plug and the line, the peripheral circuit includes
a transistor including a gate electrode and source and drain diffusion regions, the source and drain diffusion regions located in the semiconductor substrate, andthe source and drain diffusion regions each have a higher impurity concentration than an impurity concentration of the floating diffusion. |
地址 |
Osaka JP |