发明名称 Solid-state imaging device and method of manufacturing the same
摘要 A solid-state imaging device includes: a semiconductor substrate; a pixel unit formed on the semiconductor substrate; and a peripheral circuit unit formed on the semiconductor substrate, at a periphery of the pixel unit, in which the pixel unit includes: a photoelectric conversion film which converts incident light into charges; and a floating diffusion which holds the charges, the peripheral circuit unit includes a transistor including a gate electrode and two source and drain diffusion regions, and the two source and drain diffusion regions have a higher impurity concentration than an impurity concentration of the floating diffusion.
申请公布号 US9406722(B2) 申请公布日期 2016.08.02
申请号 US201414554027 申请日期 2014.11.25
申请人 PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. 发明人 Moriyama Yoshiya;Fujimoto Hiromasa;Saeki Kosaku;Takahashi Nobuyoshi
分类号 H01L29/08;H01L51/00;H01L27/30;H01L27/146;H01L21/265;H01L29/423;H01L21/324 主分类号 H01L29/08
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A solid-state imaging device comprising: a semiconductor substrate; a pixel; and a peripheral circuit at a periphery of the pixel, wherein the pixel includes: a photoelectric conversion film which converts incident light into charges; anda floating diffusion, in the semiconductor substrate, for holding the charges,a non-metal contact plug connected with the floating diffusion,a line connected with the non-metal contact plug, the floating diffusion and the photoelectric conversion film being connected to each other via the non-metal contact plug and the line, the peripheral circuit includes a transistor including a gate electrode and source and drain diffusion regions, the source and drain diffusion regions located in the semiconductor substrate, andthe source and drain diffusion regions each have a higher impurity concentration than an impurity concentration of the floating diffusion.
地址 Osaka JP