发明名称 |
Copper-Titanium Alloy for Electronic Component |
摘要 |
The present invention controls the fluctuations of Ti concentration in a copper titanium alloy from a perspective different from conventional perspectives to improve the strength and bending workability of the copper titanium alloy. A copper titanium alloy for electronic components comprising 2.0 to 4.0 mass % of Ti, and 0 to 0.5 mass %, in total, of one or more elements selected from the group consisting of Fe, Co, Mg, Si, Ni, Cr, Zr, Mo, V, Nb, Mn, B, and P as a third element, with the balance being copper and unavoidable impurities, wherein a coefficient of variation in a Ti concentration fluctuation curve is 0.2 to 0.8, the Ti concentration fluctuation curve being obtained when Ti in a matrix phase for <100>-oriented crystal grains in a cross section parallel to a rolling direction is subjected to line analysis by EDX, and in structure observation of a cross section parallel to the rolling direction, a number of second-phase particles having a size of 3 μm or more per an observation field of view of 10000 μm2 is 35 or less. |
申请公布号 |
US2016326611(A1) |
申请公布日期 |
2016.11.10 |
申请号 |
US201415108338 |
申请日期 |
2014.09.11 |
申请人 |
JX Nippon Mining & Metals Corporation |
发明人 |
Horie Hiroyasu |
分类号 |
C22C9/00;H01B1/02;C22F1/08 |
主分类号 |
C22C9/00 |
代理机构 |
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代理人 |
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主权项 |
1. A copper titanium alloy for electronic components comprising 2.0 mass % to 4.0 mass % of Ti, and 0 mass % to 0.5 mass %, in total, of one or more elements selected from the group consisting of Fe, Co, Mg, Si, Ni, Cr, Zr, Mo, V, Nb, Mn, B, and P as a third element, with the balance being copper and unavoidable impurities, wherein a coefficient of variation in a Ti concentration fluctuation curve is 0.2 to 0.8, the Ti concentration fluctuation curve being obtained when Ti in a matrix phase for <100>-oriented crystal grains in a cross section parallel to a rolling direction is subjected to line analysis by EDX, and in structure observation of a cross section parallel to the rolling direction, a number of second-phase particles having a size of 3 μm or more per an observation field of view of 10000 μm2 is 35 or less. |
地址 |
Tokyo JP |