发明名称 Fabrication of gated electron-emitting device utilizing distributed particles to form gate openings typically beveled and/or combined with lift-off or electrochemical removal of excess emitter material
摘要 A gated electron-emitter is fabricated by a process in which particles (26) are deposited over an insulating layer (24). Gate material is provided over the insulating layer in the space between the particles after which the particles and any overlying material are removed. The remaining gate material forms a gate layer (28A or 48A) through which gate openings (30 or 50) extend at the locations of the removed particles. When the gate material deposition is performed so that part of the gate material extends into the spaces below the particles, the gate openings are beveled. The insulating layer is etched through the gate openings to form dielectric openings (32 or 52). Electron-emissive elements (36A or 56A) are formed in the dielectric openings. This typically involves introducing emitter material through the gate openings into the dielectric openings and using a lift-off layer (34), or an electrochemical technique, to remove excess emitter material.
申请公布号 US5865657(A) 申请公布日期 1999.02.02
申请号 US19960660537 申请日期 1996.06.07
申请人 CANDESCENT TECHNOLOGIES CORPORATION 发明人 HAVEN, DUANE A.;LUDWIG, PAUL N.;SPINDT, CHRISTOPHER J.;DOBKIN, DANIEL M.
分类号 H01J1/304;H01J9/02;H01J29/04;H01J31/12;(IPC1-7):H01J9/02 主分类号 H01J1/304
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