发明名称 PATTERN EVALUATION METHOD AND DEVICE THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To acquire a furthermore similar value to a true value, when calculating a pattern size or edge irregularities (edge roughness) calculated from a pattern image having a noise. <P>SOLUTION: In a belt-like domain showing an edge periphery in an image, image processing parameter dependency on an edge position of a narrow part/wide part or image processing parameter dependency on an edge point position where the edge point exists on the outside part/inside part of a line is calculated, and thereby an image processing condition by which a measured value becomes sufficiently similar to the true value is calculated, or the true value is estimated. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009047494(A) 申请公布日期 2009.03.05
申请号 JP20070212532 申请日期 2007.08.17
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YAMAGUCHI ATSUKO;YAMAMOTO JIRO;KAWADA HIROKI
分类号 G01B15/00;H01L21/66 主分类号 G01B15/00
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