| 摘要 |
Provided as an electromagnetic wave microscope is a microscope comprising an image acquisition unit that, when a specimen is repeatedly moved between a plurality of regions dividing a maximum field, acquires a field image equivalent to the maximum field including both a region that includes an image of the specimen and a region that does not include an image of the specimen for each movement of the specimen, and a computation device that calculates a specimen absorption image using a plurality of the field images in which the positional relation of regions that do not include an image of the specimen and regions that include an image of the specimen differ. |
