发明名称 Image sensors for robust on chip phase detection, and associated system and methods
摘要 An image sensor for on-chip phase detection includes a pixel array for capturing an image of a scene, wherein the pixel array has a plurality of horizontal phase-detection rows, each including phase-detection pixels for detecting horizontal change in the scene, and a plurality of vertical phase-detection columns, each including phase-detection pixels for detecting vertical change in the scene, and wherein each of the horizontal phase-detection rows intersects each of the vertical phase-detection columns. A phase-detection method includes generating a pair of horizontal line profiles using one of a plurality of phase-detection rows; generating a pair of vertical line profiles using one of a plurality of phase-detection columns intersecting with the one of a plurality of phase-detection rows; and determining phase shift associated with at least one arbitrarily oriented edge in a scene, based upon the pair of horizontal line profiles and the pair of vertical line profiles.
申请公布号 US9485442(B1) 申请公布日期 2016.11.01
申请号 US201514714997 申请日期 2015.05.18
申请人 OmniVision Technololgies, Inc. 发明人 Li Chengjun;Liu Guansong;Shan Jizhang;Pang Chin Poh
分类号 H04N5/369;H04N5/232;H04N9/04 主分类号 H04N5/369
代理机构 Lathrop & Gage LLP 代理人 Lathrop & Gage LLP
主权项 1. An image sensor for on-chip phase detection, comprising: a pixel array for capturing an image of a scene, the pixel array including: a plurality of horizontal phase-detection rows, each including a first plurality of phase-detection pixels, comprising a plurality of left-masked pixels and a plurality of right-masked pixels, for detecting horizontal change in the scene, anda plurality of vertical phase-detection columns, each including a second plurality of phase-detection pixels, comprising a plurality of top-masked pixels and a plurality of bottom-masked pixels, for detecting vertical change in the scene; wherein each of the plurality of horizontal phase-detection rows intersects each of the plurality of vertical phase-detection columns.
地址 Santa Clara CA US