发明名称 A THERMAL CONDUCTING TRENCH IN A SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
摘要 <p>The invention relates to a method of forming a trench filled with a thermally conducting material in a semiconductor substrate. In one embodiment, the method includes filling a portion of the trench with a thermally conducting material and patterning a contact to the thermally conducting material. The invention also relates to a semiconductor device. In one embodiment, the semiconductor device has a trench defining a cell region, wherein a portion of the trench includes a thermally conducting material, and a contact to the thermally conducting material. The invention further relates to a semiconductor device and a method of forming a semiconductor device with an interlayer dielectric that is a thermally conducting material.</p>
申请公布号 EP0983612(A1) 申请公布日期 2000.03.08
申请号 EP19980913144 申请日期 1998.03.25
申请人 INTEL CORPORATION 发明人 LIANG, CHUNLIN;DOYLE, BRIAN, S.
分类号 H01L21/762;H01L21/763;H01L23/367;H01L29/10;H01L29/417;H01L29/78;(IPC1-7):H01L27/108;H01L27/095;H01L29/68 主分类号 H01L21/762
代理机构 代理人
主权项
地址