发明名称 PROCESSING APPARATUS, MEASURING APPARATUS, AND DEVICE MANUFACTURING METHOD
摘要 A processing apparatus includes a sealed vacuum chamber which contains a processing portion; a pressure controlling system which keeps the internal pressure of the sealed vacuum chamber constant at a predetermined level by exhausting the ambient gas in the sealed vacuum chamber; and an ambience gas recirculating system which recirculates the ambience gas exhausted from the sealed vacuum chamber back into the sealed vacuum chamber; wherein the ambience gas recirculated by the ambience. gas recirculating system is blown into the sealed vacuum chamber so that a gas flow is generated in a predetermined direction along the processing portion.
申请公布号 US2002094306(A1) 申请公布日期 2002.07.18
申请号 US19990257258 申请日期 1999.02.25
申请人 HARA SHINICHI;TANAKA YUTAKA;TERASHIMA SHIGERU;HASEGAWA TAKAYUKI;MATSUI SHIN 发明人 HARA SHINICHI;TANAKA YUTAKA;TERASHIMA SHIGERU;HASEGAWA TAKAYUKI;MATSUI SHIN
分类号 H01L21/027;G03F7/20;G05D16/00;G05D16/20;(IPC1-7):G05D16/00 主分类号 H01L21/027
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