发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent a temperature of an object to be treated in the case of irradiation from being raised each time of the irradiation, in a crystallization process of a semiconductor thin film which forms an irradiation region overlapped partially by using two or more laser oscillators of different oscillation wavelengths, and which performs the next irradiation so as to overlap with a part of the irradiation region. SOLUTION: The irradiation intensity of a first laser beam is set to be distributed unevenly in a relative moving direction where irradiation distribution is provided so that the intensity of the first laser beam may be larger on a downstream side than on an upstream side in the relative moving direction of a mask regarding the moving direction of the irradiation region made by the first laser beam and a second laser beam. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007221062(A) 申请公布日期 2007.08.30
申请号 JP20060042831 申请日期 2006.02.20
申请人 SHARP CORP 发明人 KASHIWAGI IKUMI;SEKI MASANORI;TSUNASAWA HIROSHI;NAKAYAMA JUNICHIRO;TAKEUCHI HIROAKI
分类号 H01L21/20;H01L21/336;H01L29/786 主分类号 H01L21/20
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