发明名称 NONVOLATILE SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To reduce the size of a nonvolatile memory cell. SOLUTION: A nonvolatile semiconductor memory has a substrate 1 having stripe-like trenches 50, each first electrode 10 buried in the bottom of each trench 50, each second electrode 20 covering the surface of the substrate interposed between the adjacent first electrodes to each other, each diffusion layer 40 served as each source or each drain, and each trap film 30 served as a charge accumulating layer. Each diffusion layer 40 is formed only under the bottom surface of each trench 50, or is formed only under the surface of the substrate present in each RI interposed between the trenches. Each trap film 30 is formed between either one of the electrodes opposed to each diffusion layer 40 and the side surface of each trench 50. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007220914(A) 申请公布日期 2007.08.30
申请号 JP20060039778 申请日期 2006.02.16
申请人 NEC ELECTRONICS CORP 发明人 KASHIMURA MASAHIKO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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