发明名称 Method for fabricating nanowires for horizontal gate all around devices for semiconductor applications
摘要 The present disclosure provide methods for forming nanowire structures with desired materials horizontal gate-all-around (hGAA) structures field effect transistor (FET) for semiconductor chips. In one example, a method of forming nanowire structures on a substrate includes supplying an oxygen containing gas mixture to a multi-material layer on a substrate in a processing chamber, wherein the multi-material layer includes repeating pairs of a first layer and a second layer, the first and the second layers having a first group and a second group of sidewalls respectively exposed through openings defined in the multi-material layer, and selectively forming an oxidation layer on the second group of sidewalls in the second layer.
申请公布号 US9484406(B1) 申请公布日期 2016.11.01
申请号 US201514874146 申请日期 2015.10.02
申请人 APPLIED MATERIALS, INC. 发明人 Sun Shiyu;Yoshida Naomi;Wood Bingxi
分类号 H01L29/423;H01L29/06;H01L21/02;H01L29/165;H01L29/41 主分类号 H01L29/423
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A method of forming nanowire structures on a substrate comprising: supplying an oxygen containing gas mixture to a multi-material layer on a substrate in a processing chamber, wherein the multi-material layer includes repeating pairs of a first layer and a second layer, the first and the second layers having a first group and a second group of sidewalls respectively exposed through openings defined in the multi-material layer; selectively forming an oxidation layer on the second group of sidewalls in the second layer; and forming horizontal gate-all-around (hGAA) structures using the openings defined in the multi-material layer.
地址 Santa Clara CA US