发明名称 |
SEMICONDUCTOR COMPONENTS WITH GATE DIELECTRIC LAYER HAVING RESPECTIVELY DIFFERENT NITROGEN DENSITY AND METHOD OF MAKING THE SAME |
摘要 |
PURPOSE: NMOS transistor and PMOS transistor comprising CMOS transistor secure reliability of each gate insulating film and each NMOS transistor and PMOS transistor supply optimal working condition. CONSTITUTION: It comprises a transistor forming the second electric conducting channel in the first electric conducting area, a semiconductor substrate with a transistor forming the first electric conducting channel in the second electric conducting area, the first gate insulating film that is formed on the surface of the first electric conducting area and formed with an oxide film containing the first nitrogen density and the second gate insulating film that is formed with an oxide film having the second nitrogen density that is thinner than the first nitrogen density in the surface of the second electric conducting area.
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申请公布号 |
KR20000009098(A) |
申请公布日期 |
2000.02.15 |
申请号 |
KR19980029290 |
申请日期 |
1998.07.21 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
LEE, TAE JUNG |
分类号 |
H01L29/78;H01L21/8238;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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