| 摘要 |
Provided is an automatic thin section sample preparation device (1) including: a reading portion (20) which reads the ID data; a first imaging portion (27) which images a surface image of an embedding block (B); a sample preparation mechanism (50) which prepares a thin section (M) by thinly cutting the embedding block, fixes the thin section to a substrate (G), and prepares a thin section sample (H); a second imaging portion (34) which images a thin section image of the thin section in the thin section sample; a recording portion (35) which records individual data on the substrate in the thin section sample; and a control portion (12). The control portion includes a determination portion (12b) which determines whether or not the thin section is prepared from an original embedding block by collating the surface image and the thin section image, and a storage portion (12c) which stores the determination result from the determination portion in association with the ID data, as the individual data. |
