发明名称 半導体装置
摘要 In a semiconductor device including semiconductor modules, it is possible to average the temperatures of the semiconductor modules. At least two semiconductor modules, wherein a plurality of semiconductor circuits, on which are mounted one or more semiconductor chips having a gate terminal and gate resistors connected to the gate terminals, are disposed in parallel, are disposed above a cooling body so that an array direction of the semiconductor circuits is a direction intersecting a refrigerant flow. At least one temperature detecting resistor is disposed in each semiconductor module, a gate signal is supplied to a gate signal input terminal of one semiconductor module of the at least two semiconductor modules via the temperature detecting resistor of the other semiconductor module, and a gate signal is supplied to a gate signal input terminal of the other semiconductor module via the temperature detecting resistor of the one semiconductor module.
申请公布号 JP6040656(B2) 申请公布日期 2016.12.07
申请号 JP20120202078 申请日期 2012.09.13
申请人 富士電機株式会社 发明人 岡本 有人
分类号 H01L25/07;H01L23/467;H01L23/58;H01L25/18;H02M7/48 主分类号 H01L25/07
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