发明名称 STRUCTURED ILLUMINATION MICROSCOPE SYSTEM, METHOD, AND PROGRAM
摘要 In order to increase the performance of deep observation, this structured illumination microscope system according to the present invention comprises: an illumination optical system that irradiates a sample with an interference fringe of excitation light for exciting a fluorescent material contained in the sample; a control unit for controlling the direction, the phase, and the spatial frequencies of the interference fringe; an image forming optical system for forming the image of the sample modulated by the irradiation of the interference fringe; an imaging element for capturing the image formed by the image forming optical system; and a demodulation unit for performing demodulation using a plurality of the images captured by the imaging element. The control unit controls the spatial frequencies of the interference fringe in accordance with the irradiation position of the interference fringe.
申请公布号 WO2016199179(A1) 申请公布日期 2016.12.15
申请号 WO2015JP02870 申请日期 2015.06.08
申请人 NIKON CORPORATION 发明人 OUCHI, Yumiko
分类号 G02B21/06;G01N21/64 主分类号 G02B21/06
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