发明名称 Method of making a storage electrode of DRAM cell
摘要 A storage electrode of a DRAM cell in a highly-integrated semiconductor device has, in order to secure the surface area thereof greater than that of a conventional tunnel-type storage electrode, an upper plate of storage electrode formed over a lower plate of storage electrode separated therefrom by a predetermined distance, while interposing bars of various shapes formed of a conductive layer to electrically connect the upper and lower plates, and a method for manufacturing the storage electrode is also provided.
申请公布号 US5405799(A) 申请公布日期 1995.04.11
申请号 US19930138204 申请日期 1993.10.20
申请人 HYUNDAI ELECTRONICS INDUSTRIES, CO., INC. 发明人 WOO, SANG H.;JEON, HA E.;PARK, YOUNG J.
分类号 H01L21/28;H01L21/033;H01L21/306;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;(IPC1-7):H01L21/70 主分类号 H01L21/28
代理机构 代理人
主权项
地址