发明名称 Increase dram node capacitance by etching rough surface
摘要 A capacitor and method of forming the capacitor for high density applications. The capacitor (100) comprises a storage node (106) having waves (108) formed on the vertical surfaces thereof. The waves (108) are created using a silylated photoresist. The conditions of silylation and subsequent etch are such that, when etched, the silylated photoresist has waves on the vertical edges thereof. During the etch to form the storage node (106), the waves are transferred to the storage node (106). Waves (108) increase the surface area of the storage node (106) and thus the resulting capacitance.
申请公布号 US5753419(A) 申请公布日期 1998.05.19
申请号 US19960713337 申请日期 1996.09.13
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 MISIUM, GEORGE R.
分类号 H01L27/04;G03F7/26;G03F7/40;H01L21/02;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):G03F7/00 主分类号 H01L27/04
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