发明名称 |
PROBE APPARATUS FOR TESTING LIQUID CRYSTAL DISPLAY |
摘要 |
PURPOSE: A probe apparatus is provided to judge the goodness and the badness of a thin film transistor liquid crystal display by exactly detecting a pixel operation signal. CONSTITUTION: A probe apparatus comprises a plurality of thin film probe members each of which has a transfer tip for transferring an operation signal of a pixel. An insulation guide film is located at an upper part of the probe members, and has a plurality of guide holes penetrating the transfer tip. An insulation ceramic pole is received in a fixing hole so as to maintain the fixing of an arrangement position of a probe tip of the probe member. A probe body is located at an upper part of the probe member, and a fixing block is located between the probe body and the probe member so as to fix the probe body to an external assembly. A pair of guide plate fixes the probe members and are coupled with one side and the other side of the probe body, respectively.
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申请公布号 |
KR20000074037(A) |
申请公布日期 |
2000.12.05 |
申请号 |
KR19990017705 |
申请日期 |
1999.05.17 |
申请人 |
INTERNATIONAL TECHNOLOGY CO., LTD. |
发明人 |
LEE, SEOK HAENG |
分类号 |
G01R1/067;(IPC1-7):G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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