发明名称 PROBE APPARATUS FOR TESTING LIQUID CRYSTAL DISPLAY
摘要 PURPOSE: A probe apparatus is provided to judge the goodness and the badness of a thin film transistor liquid crystal display by exactly detecting a pixel operation signal. CONSTITUTION: A probe apparatus comprises a plurality of thin film probe members each of which has a transfer tip for transferring an operation signal of a pixel. An insulation guide film is located at an upper part of the probe members, and has a plurality of guide holes penetrating the transfer tip. An insulation ceramic pole is received in a fixing hole so as to maintain the fixing of an arrangement position of a probe tip of the probe member. A probe body is located at an upper part of the probe member, and a fixing block is located between the probe body and the probe member so as to fix the probe body to an external assembly. A pair of guide plate fixes the probe members and are coupled with one side and the other side of the probe body, respectively.
申请公布号 KR20000074037(A) 申请公布日期 2000.12.05
申请号 KR19990017705 申请日期 1999.05.17
申请人 INTERNATIONAL TECHNOLOGY CO., LTD. 发明人 LEE, SEOK HAENG
分类号 G01R1/067;(IPC1-7):G01R1/067 主分类号 G01R1/067
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