发明名称 Method of fabricating semiconductor memory device in which an oxide film fills a trench in a semiconductor substrate
摘要 A method of fabricating a semiconductor device includes applying a coating oxide film to a surface of a substrate including a semiconductor substrate so that a recess formed in the surface is filled with the coating oxide film, applying a steam oxidation treatment to the substrate at a first temperature, soaking the substrate in heated water while applying a megasonic wave to the substrate in the heated water, and applying a steam oxidation treatment to the substrate at a second temperature higher than the first temperature.
申请公布号 US7651924(B2) 申请公布日期 2010.01.26
申请号 US20080233052 申请日期 2008.09.18
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KAWAMOTO HIROSHI;KAI NAOKI;MATSUNO KOICHI;KAJIMOTO MINORI
分类号 H01L21/76;H01L21/31;H01L21/469 主分类号 H01L21/76
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