发明名称 |
Semiconductor integrated circuit device with trench capacitor and method of manufacturing the same |
摘要 |
A semiconductor integrated circuit device includes a p-silicon substrate, an n-buried layer formed in the substrate to divide the substrate into an upper region and a lower region, a trench formed from the surface of the substrate to the lower region of the substrate through the buried layer, and an electrode formed in the trench. The electrode forms an n-inversion layer using the buried layer as a carrier source, in the lower region of the semiconductor substrate by a field effect. The n-inversion layer constitutes a capacitor together with the electrode.
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申请公布号 |
US6150686(A) |
申请公布日期 |
2000.11.21 |
申请号 |
US19980063779 |
申请日期 |
1998.04.22 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
SUGIURA, SOICHI;SUGIMOTO, SHIGEKI |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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