发明名称 APPARATUS AND METHOD FOR SUBSTANTIALLY SIMULTANEOUS MEASUREMENT OF EMISSIONS
摘要 <p>An apparatus and method for measuring an emission is provided. A source (12) of an excitation beam (14) is provided. In the path of the excitation beam (14), means (18) are located for providing one or more daughter beams (20). The one or more daughter beams (20) are directed at one or more substances (28). The substances (28) may include one or more known qualified substances (30), and one or more known unqualified substances (32). The substances (28) have substantially similar characterizations. Positionable adjacent to the one or more substances (28) are means (44) for generating one or more emission beams (42). A spectral measurements substantially simultaneously from the one or more emission beams (42). Means are provided for comparing the spectral measurements from the one or more substances (28).</p>
申请公布号 WO2002001169(A1) 申请公布日期 2002.01.03
申请号 US2001041161 申请日期 2001.06.25
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