发明名称 |
Group III-N nanowire transistors |
摘要 |
A group III-N nanowire is disposed on a substrate. A longitudinal length of the nanowire is defined into a channel region of a first group III-N material, a source region electrically coupled with a first end of the channel region, and a drain region electrically coupled with a second end of the channel region. A second group III-N material on the first group III-N material serves as a charge inducing layer, and/or barrier layer on surfaces of nanowire. A gate insulator and/or gate conductor coaxially wraps completely around the nanowire within the channel region. Drain and source contacts may similarly coaxially wrap completely around the drain and source regions. |
申请公布号 |
US9397188(B2) |
申请公布日期 |
2016.07.19 |
申请号 |
US201514936609 |
申请日期 |
2015.11.09 |
申请人 |
Intel Corporation |
发明人 |
Then Han Wui;Chau Robert;Chu-Kung Benjamin;Dewey Gilbert;Kavalieros Jack;Metz Matthew;Mukherjee Niloy;Pillarisetty Ravi;Radosavljevic Marko |
分类号 |
H01L29/66;H01L29/20;H01L29/06;H01L27/088;H01L29/775;H01L29/778;H01L29/786;H01L29/78;B82Y10/00;H01L21/02 |
主分类号 |
H01L29/66 |
代理机构 |
Blakely, Sokoloff, Taylor & Zafman LLP |
代理人 |
Blakely, Sokoloff, Taylor & Zafman LLP |
主权项 |
1. A method of forming a group III-N transistor on a substrate, the method comprising:
epitaxially growing a stack of semiconductor materials on the substrate, the stack comprising at least a first group III-N material; etching the stack to define a nanowire; epitaxially growing a second group III-N material on the first group III-N material along a channel region of the nanowire; and forming a gate conductor coaxially wrapping completely around the first semiconductor and over the second group III-N material, along a longitudinal channel length of the nanowire. |
地址 |
Santa Clara CA US |