发明名称 Group III-N nanowire transistors
摘要 A group III-N nanowire is disposed on a substrate. A longitudinal length of the nanowire is defined into a channel region of a first group III-N material, a source region electrically coupled with a first end of the channel region, and a drain region electrically coupled with a second end of the channel region. A second group III-N material on the first group III-N material serves as a charge inducing layer, and/or barrier layer on surfaces of nanowire. A gate insulator and/or gate conductor coaxially wraps completely around the nanowire within the channel region. Drain and source contacts may similarly coaxially wrap completely around the drain and source regions.
申请公布号 US9397188(B2) 申请公布日期 2016.07.19
申请号 US201514936609 申请日期 2015.11.09
申请人 Intel Corporation 发明人 Then Han Wui;Chau Robert;Chu-Kung Benjamin;Dewey Gilbert;Kavalieros Jack;Metz Matthew;Mukherjee Niloy;Pillarisetty Ravi;Radosavljevic Marko
分类号 H01L29/66;H01L29/20;H01L29/06;H01L27/088;H01L29/775;H01L29/778;H01L29/786;H01L29/78;B82Y10/00;H01L21/02 主分类号 H01L29/66
代理机构 Blakely, Sokoloff, Taylor & Zafman LLP 代理人 Blakely, Sokoloff, Taylor & Zafman LLP
主权项 1. A method of forming a group III-N transistor on a substrate, the method comprising: epitaxially growing a stack of semiconductor materials on the substrate, the stack comprising at least a first group III-N material; etching the stack to define a nanowire; epitaxially growing a second group III-N material on the first group III-N material along a channel region of the nanowire; and forming a gate conductor coaxially wrapping completely around the first semiconductor and over the second group III-N material, along a longitudinal channel length of the nanowire.
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