发明名称 |
Nonvolatile memory device, a storage device having the same and an operating method of the same |
摘要 |
An operating method of a nonvolatile memory device including a plurality of strings each string including at least two pillars penetrating wordlines disposed at different layers. The operating method includes applying unselected wordline voltages to unselected wordlines, and applying a selected wordline voltage to a selected wordline, and the unselected wordline voltage applied to the same layer as a layer of the selected wordline is different from the unselected wordline voltage applied to a different layer than the layer of the selected wordline. |
申请公布号 |
US9460795(B2) |
申请公布日期 |
2016.10.04 |
申请号 |
US201514792678 |
申请日期 |
2015.07.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Kwak DongHun |
分类号 |
G11C16/10;G11C16/04;G11C16/26;H01L27/115 |
主分类号 |
G11C16/10 |
代理机构 |
F. Chau & Associates, LLC |
代理人 |
F. Chau & Associates, LLC |
主权项 |
1. An operating method of a nonvolatile memory device including a plurality of strings each string including at least two pillars penetrating wordlines disposed at different layers, the operating method comprising:
applying unselected wordline voltages to unselected wordlines; and applying a selected wordline voltage to a selected wordline, wherein the unselected wordline voltage applied to the same layer as a layer of the selected wordline is different from the unselected wordline voltage applied to a different layer than the layer of the selected wordline, wherein during a program operation including a pass voltage applying period and a program voltage applying period, the different wordline voltages are applied at one of the pass voltage applying period and the program voltage applying period. |
地址 |
Suwon-Si, Gyeonggi-Do KR |