发明名称 Method for producing SiC substrate
摘要 A method of manufacturing a SiC substrate of the invention includes at least an oxide film-forming process of forming an oxide film (10) to cover a surface (1a) of the SiC substrate (1); and a planarization process of polishing the SiC substrate (1) from an oxide film side (10) in accordance with a CMP method so as to remove the oxide film (10), and of polishing the surface (1a) of the SiC substrate (1) to planarize the surface (1a).
申请公布号 US9502230(B2) 申请公布日期 2016.11.22
申请号 US201314648730 申请日期 2013.11.27
申请人 SHOWA DENKO K.K. 发明人 Sasaki Yuzo;Suzuki Kenji
分类号 H01L21/02;H01L29/16 主分类号 H01L21/02
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A method of manufacturing a SiC substrate which includes a process of polishing and planarizing a surface of the SiC substrate, the method comprising at least: an oxide film-forming process of forming an oxide film to cover the surface of the SiC substrate; and a planarization process of polishing the SiC substrate from an oxide film side in accordance with a chemical mechanical polishing (CMP) method so as to completely remove the oxide film, and of polishing the surface of the SiC substrate to planarize the surface, wherein in the oxide film-forming process, the oxide film is formed by a P-CVD method or a RF sputtering method and the oxide film is formed in a film thickness of 0.5 μm or greater.
地址 Tokyo JP