发明名称 Sensor array for rapid materials characterization
摘要 A sensor-array based materials characterization apparatus for characterizing one or more material properties of at least five test samples, wherein the apparatus includes a sensor array disposed on a substrate; electronic test circuitry for sending electrical signals to and receiving electrical signals from the sensor array; electronic circuitry for routing signals between selected sensors and the electronic test circuitry; and a computer or processor electrically coupled to electronic test circuitry and electronic circuitry.
申请公布号 US6477479(B1) 申请公布日期 2002.11.05
申请号 US19980210428 申请日期 1998.12.11
申请人 SYMYX TECHNOLOGIES 发明人 MANSKY PAUL;BENNETT JAMES
分类号 B01J19/00;C40B30/08;C40B40/18;G01N25/00;G01N25/18;G01N27/72;(IPC1-7):G06F17/00 主分类号 B01J19/00
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