发明名称 |
Sensor array for rapid materials characterization |
摘要 |
A sensor-array based materials characterization apparatus for characterizing one or more material properties of at least five test samples, wherein the apparatus includes a sensor array disposed on a substrate; electronic test circuitry for sending electrical signals to and receiving electrical signals from the sensor array; electronic circuitry for routing signals between selected sensors and the electronic test circuitry; and a computer or processor electrically coupled to electronic test circuitry and electronic circuitry.
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申请公布号 |
US6477479(B1) |
申请公布日期 |
2002.11.05 |
申请号 |
US19980210428 |
申请日期 |
1998.12.11 |
申请人 |
SYMYX TECHNOLOGIES |
发明人 |
MANSKY PAUL;BENNETT JAMES |
分类号 |
B01J19/00;C40B30/08;C40B40/18;G01N25/00;G01N25/18;G01N27/72;(IPC1-7):G06F17/00 |
主分类号 |
B01J19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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