发明名称 Semiconductor device, and production method for manufacturing such semiconductor device
摘要 A semiconductor device has a semiconductor substrate, and a multi-layered wiring arrangement provided thereon. The multi-layered wring arrangement includes at least one insulating layer structure having a metal wiring pattern formed therein. The insulating layer structure includes a first SiOCH layer, a second SiOCH layer formed on the first SiOCH layer, and a silicon dioxide (SiO2) layer formed on the second SiOCH layer. The second SiOCH layer features a carbon (C) density lower than that of the first SiOCH layer, a hydrogen (H) density lower than that of the first SiOCH layer, and an oxygen (O) density higher than that of the first SiOCH layer.
申请公布号 US2004183162(A1) 申请公布日期 2004.09.23
申请号 US20040767786 申请日期 2004.01.29
申请人 NEC ELECTRONICS CORPORATION 发明人 OHTO KOICHI;USAMI TATSUYA;MORITA NOBORU;OHNISHI SADAYUKI;ARITA KOJI;KITAO RYOHEI;SASAKI YOICHI
分类号 H01L23/522;H01L21/3205;H01L21/768;H01L23/52;H01L23/532;(IPC1-7):H01L23/58 主分类号 H01L23/522
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