发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, AND METHOD OF INSPECTING INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a standard cell capable of easily finding a signal line in which much current is flown in a circuit to be designed and easily measuring the current in the portion. SOLUTION: The standard cell having at least two test pads for detecting current is arranged in an automatic layout. The two test pads are used as test pads for measuring current, by cutting wiring for connecting the two test pads. Additionally, the two test pads in the standard cell may be connected via wiring in which current flow is cut off by the flow of excess current. Alternatively, a memory or an analog switch may be provided on a wiring portion for connecting the two test pads. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007324319(A) 申请公布日期 2007.12.13
申请号 JP20060151862 申请日期 2006.05.31
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ITO MASANORI
分类号 H01L21/822;H01L21/82;H01L27/04 主分类号 H01L21/822
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