发明名称 |
SEMICONDUCTOR DEVICES HAVING GATE STRUCTURES WITH SKIRT REGIONS |
摘要 |
Provided are a semiconductor device and a method for fabricating the same. The semiconductor device includes an active fin protruding upwardly from a substrate and extending in a first direction and a gate structure extending in a second direction intersecting to cross the active fin, where a first width of a lower portion of the gate structure that contacts the active fin is greater than a second width of the lower portion of the gate structure that is spaced apart from the active fin. |
申请公布号 |
US2016204264(A1) |
申请公布日期 |
2016.07.14 |
申请号 |
US201614988819 |
申请日期 |
2016.01.06 |
申请人 |
You Jung-Gun;Um Myung-Yoon;Park Young-Joon;Lee Jeong-Hyo;Ha Ji-Yong;Hwang Jun-Sun |
发明人 |
You Jung-Gun;Um Myung-Yoon;Park Young-Joon;Lee Jeong-Hyo;Ha Ji-Yong;Hwang Jun-Sun |
分类号 |
H01L29/78;H01L29/423 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
an active fin protruding from a substrate and extending in a first direction; a gate structure extending in a second direction that intersects the first direction, the gate structure on the active fin; and a field insulation layer on a bottom portion of a long side of the active fin, an intersection of a top surface of the field insulation layer and the active fin defining at least one line segment, wherein the gate structure includes a skirt that extends outwardly in the first direction to cover a portion of the at least one line segment while leaving another portion of the at least one line segment exposed. |
地址 |
Ansan-si KR |