发明名称 SEMICONDUCTOR DEVICES HAVING GATE STRUCTURES WITH SKIRT REGIONS
摘要 Provided are a semiconductor device and a method for fabricating the same. The semiconductor device includes an active fin protruding upwardly from a substrate and extending in a first direction and a gate structure extending in a second direction intersecting to cross the active fin, where a first width of a lower portion of the gate structure that contacts the active fin is greater than a second width of the lower portion of the gate structure that is spaced apart from the active fin.
申请公布号 US2016204264(A1) 申请公布日期 2016.07.14
申请号 US201614988819 申请日期 2016.01.06
申请人 You Jung-Gun;Um Myung-Yoon;Park Young-Joon;Lee Jeong-Hyo;Ha Ji-Yong;Hwang Jun-Sun 发明人 You Jung-Gun;Um Myung-Yoon;Park Young-Joon;Lee Jeong-Hyo;Ha Ji-Yong;Hwang Jun-Sun
分类号 H01L29/78;H01L29/423 主分类号 H01L29/78
代理机构 代理人
主权项 1. A semiconductor device comprising: an active fin protruding from a substrate and extending in a first direction; a gate structure extending in a second direction that intersects the first direction, the gate structure on the active fin; and a field insulation layer on a bottom portion of a long side of the active fin, an intersection of a top surface of the field insulation layer and the active fin defining at least one line segment, wherein the gate structure includes a skirt that extends outwardly in the first direction to cover a portion of the at least one line segment while leaving another portion of the at least one line segment exposed.
地址 Ansan-si KR