发明名称 Method for sensing degradation of organic light emitting display
摘要 A method for sensing degradation of an organic light emitting display includes an initialization step for applying a sensing data voltage to a gate node of a driving TFT and applying an initialization voltage to a source node of the driving TFT, a boosting step for floating the gate node and the source node of the driving TFT and applying a drain-to-source current of the driving TFT to an organic element, a sensing step for again applying the initialization voltage to the source node of the driving TFT, setting a gate-to-source voltage of the driving TFT depending on a degradation degree of the organic element, and storing the drain-to-source current of the driving TFT determined by the set gate-to-source voltage in a line capacitor, and a sampling step for outputting a voltage stored in the line capacitor as a sensing voltage.
申请公布号 US9396675(B2) 申请公布日期 2016.07.19
申请号 US201414584071 申请日期 2014.12.29
申请人 LG DISPLAY CO., LTD. 发明人 Kim Changhee;Oh Kilhwan;Shin Hunki
分类号 G09G3/00;G09G3/32 主分类号 G09G3/00
代理机构 Fenwick & West LLP 代理人 Fenwick & West LLP
主权项 1. A method for sensing degradation of an organic light emitting display including a plurality of subpixels each including an organic element and a driving thin film transistor (TFT) controlling an emission amount of the organic element and a sensing unit connected to at least one of the plurality of subpixels through a sensing line, the method comprising: during an initialization period, applying a sensing data voltage to a gate node of the driving TFT and applying an initialization voltage to a source node of the driving TFT to turn on the driving TFT; during a boosting period, floating the gate node and the source node of the driving TFT and applying a drain-to-source current of the driving TFT to the organic element to turn on the organic element; during a sensing period, again applying the initialization voltage to the source node of the driving TFT, a gate-to-source voltage of the driving TFT set to be indicative of a degradation degree of the organic element as a result of again applying the initialization voltage, and charging a line capacitor of the sensing line with the drain-to-source current of the driving TFT that is controlled by the set gate-to-source voltage; and during a sampling period, outputting a voltage of the line capacitor as a sensing voltage.
地址 Seoul KR