Testing head for a test equipment of electronic devices

摘要

A testing head for a test equipment of electronic devices of the type includes a plurality of contact probes inserted into guide holes which are realized in at least an upper guide and a lower guide separated one another by an air zone. Each of such contact probes include at least a probe body having a substantially rectangular section and a projecting arm from the probe body which ends with a probe tip for contacting one of a plurality of contact pads of a device to be tested. The projecting arm projects outside the probe body so as to have a lug with respect to both faces of the probe body which converge in an edge in order to define a probe tip offset and external with respect to the probe body.

主权项

1. A testing head for a test equipment of electronic devices comprising:
an upper guide and a lower guide separated from one another by an air zone and provided with respective guide holes; and a plurality of contact probes inserted into the guide holes, each of the contact probes in turn including:
a probe body having a substantially rectangular section defined by a first pair of faces parallel to each other and a second pair of faces parallel to each other, each face of the first pair being perpendicular to the faces of the second pair;a projecting arm projecting from the probe body;a probe tip as an ending portion of the projecting arm for contacting one of a plurality of contact pads of a device to be tested, wherein the projecting arm projects outside the probe body so as to have:
a lug with respect to the first and second pairs of faces of the probe body, anda tip defined by two perpendicular faces converging in an edge of the section of the probe body and being the probe tip, the probe tip being offset and external with respect to the probe body.