发明名称 |
LEAKAGE COMPENSATION CIRCUIT FOR PHASE-LOCKED LOOP (PLL) LARGE THIN OXIDE CAPACITORS |
摘要 |
Certain aspects of the present disclosure provide methods and apparatus for compensating, or at least adjusting, for capacitor leakage. One example method generally includes determining a leakage voltage corresponding to a leakage current of a capacitor in a filter for a phase-locked loop (PLL), wherein the determining comprises closing a set of switches for discontinuous sampling of the leakage voltage; based on the sampled leakage voltage, generating a sourced current approximately equal to the leakage current; and injecting the sourced current into the capacitor. |
申请公布号 |
US2016373116(A1) |
申请公布日期 |
2016.12.22 |
申请号 |
US201615257578 |
申请日期 |
2016.09.06 |
申请人 |
QUALCOMM Incorporated |
发明人 |
VAHID FAR Mohammad Bagher;BICAKCI Ara;KHALILI Alireza;BORNA Ashkan;NGUYEN Thinh Cat |
分类号 |
H03L7/08;H03L7/089;H03L7/093;H02M3/07 |
主分类号 |
H03L7/08 |
代理机构 |
|
代理人 |
|
主权项 |
1. A circuit comprising:
a first capacitor; a first transistor having a drain coupled to the first capacitor; an amplifier; a second capacitor; a first set of switches selectively coupled between the first capacitor and the second capacitor; and a second set of switches selectively coupled between an output of the amplifier and a gate of the first transistor. |
地址 |
San Diego CA US |