发明名称 WAFER INDIVIDUALIZATION METHOD BY LASER DICING
摘要 PROBLEM TO BE SOLVED: To enable a wafer subjected to full cut in a dicing apparatus to be picked up without chipping. SOLUTION: A wafer individualization method comprises the steps: of sticking the rear surface of the wafer on a dicing tape stretched over a ring-shaped dicing frame; of positioning and fixing the wafer onto a work table of the laser dicing apparatus together with the dicing frame; of fully cutting the wafer by the laser dicing to individualize it to a plurality of chips; of sticking protective tape on the surface of the wafer subjected to full cut; of transferring the wafer along with a dicing frame to a die bonder; of peeling off the protective tape from the surface of the wafer; and of expanding the dicing tape by the expanding function of the die bonder to increase the spacing between individual chips so that they can be picked up. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006229050(A) 申请公布日期 2006.08.31
申请号 JP20050042486 申请日期 2005.02.18
申请人 CANON MACHINERY INC 发明人 NAKATSU AKIRA
分类号 H01L21/301;H01L21/683 主分类号 H01L21/301
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