发明名称 METHOD OF FORMING MEMORY CIRCUITRY WITH DIFFERENT INSULATIVE SIDEWALL SPACERS
摘要 The invention includes methods of forming memory circuitry. In one implementation, a substrate is provided which has a memory array circuitry area and a peripheral circuitry area. The memory array circuitry area comprises transistor gate lines having a first minimum line spacing. The peripheral circuitry area comprises transistor gate lines having a second minimum line spacing which is greater than the first minimum line spacing. Anisotropically etched insulative sidewall spacers are formed over opposing sidewalls of individual of said transistor gate lines within the peripheral circuitry area prior to forming anisotropically etched insulative sidewall spacers over opposing sidewalls of individual of said transistor gate lines within the memory array area. Other aspects and implementations are contemplated.
申请公布号 KR20080032644(A) 申请公布日期 2008.04.15
申请号 KR20087005106 申请日期 2006.07.13
申请人 MICRON TECHNOLOGY, INC. 发明人 PAREKH KUNAL R.;MATHEW SURAJ;COLE STEVE
分类号 H01L21/336;H01L21/8242;H01L27/108 主分类号 H01L21/336
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