SYSTEM AND METHOD FOR INSPECTION OF FILMS

摘要

Disclosed herein is a method for inspection of light management films with a plurality of light refractive surface structures, including positioning at least one illumination source, and at least one imaging device are configured to be in a substantially bright field configuration and imaging at least portion of the light management film to provide an acquired image, wherein light from the at least one illumination source is refracted by the film to produce a dark field image at the at least one imaging device. A system for inspection of light management films is also provided. The system includes at least one illumination source to illuminate a first side of the film, at least one imaging device to receive light refracted through an opposite side of the light management film, wherein the illumination source and the imaging device are configured to be in a substantially bright field configuration to acquire a dark field image, a processor-controller, and a computer-readable medium including instructions for automated defect detection. The fixture, the illumination source, the imaging device, the processor-controller and the computer readable medium are operably coupled for automated defect detection.