发明名称 SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING DEVICE, AND SEMICONDUCTOR MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To prevent degradation of a cleaning effect due to accumulation of particles on a cleaning brash in cleaning a substrate. SOLUTION: In a state where two cylindrical cleaning brushes 11 and 12 are arranged in parallel to each other on a polishing object surface of a semiconductor substrate 4 after being polished, and one-side cleaning brush 11 out of the two cleaning brushes 11 and 12 is brought into contact with the semiconductor substrate 4, and the other-side cleaning brush 12 is brought into contact with the one-side cleaning brush 11 by being separated from the semiconductor substrate 2, the semiconductor substrate 4 is cleaned while supplying a cleaning fluid 19 from one-side nozzle 17. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008311481(A) 申请公布日期 2008.12.25
申请号 JP20070158714 申请日期 2007.06.15
申请人 SONY CORP 发明人 FUJII MIKA
分类号 H01L21/304 主分类号 H01L21/304
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