发明名称 Tunnel MOSFET with ferroelectric gate stack
摘要 A Tunnel Field-Effect Transistor (TFET) includes a source region in a semiconductor substrate, and a drain region in the semiconductor substrate. The source region and the drain region are of opposite conductivity types. The TFET further includes a gate stack over the semiconductor substrate, with the source region and the drain region extending to opposite sides of the gate stack. The gate stack includes a gate dielectric over the semiconductor substrate, and a ferroelectric layer over the gate dielectric.
申请公布号 US9391162(B2) 申请公布日期 2016.07.12
申请号 US201414245745 申请日期 2014.04.04
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lee Min-Hung
分类号 H01L31/0328;H01L29/861;H01L29/76;H01L29/66;H01L29/51;H01L21/02;H01L21/28;H01L29/739;H01L29/78;H01L29/10 主分类号 H01L31/0328
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A Tunnel Field-Effect Transistor (TFET) comprising: a semiconductor substrate; a source region in the semiconductor substrate; a drain region in the semiconductor substrate, wherein the source region and the drain region are of opposite conductivity types; and a gate stack over the semiconductor substrate, with the source region and the drain region extending to opposite sides of the gate stack, wherein the gate stack comprises: a gate dielectric over the semiconductor substrate, wherein the gate dielectric comprises a high-k dielectric material; anda ferroelectric layer over the gate dielectric, wherein the gate dielectric and the ferroelectric layer have a same composition, and the gate dielectric has an amorphous structure, and the ferroelectric layer has a crystalline structure; and a diffusion barrier overlying the high-k dielectric material and underlying the ferroelectric layer.
地址 Hsin-Chu TW