发明名称 |
Tunnel MOSFET with ferroelectric gate stack |
摘要 |
A Tunnel Field-Effect Transistor (TFET) includes a source region in a semiconductor substrate, and a drain region in the semiconductor substrate. The source region and the drain region are of opposite conductivity types. The TFET further includes a gate stack over the semiconductor substrate, with the source region and the drain region extending to opposite sides of the gate stack. The gate stack includes a gate dielectric over the semiconductor substrate, and a ferroelectric layer over the gate dielectric. |
申请公布号 |
US9391162(B2) |
申请公布日期 |
2016.07.12 |
申请号 |
US201414245745 |
申请日期 |
2014.04.04 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lee Min-Hung |
分类号 |
H01L31/0328;H01L29/861;H01L29/76;H01L29/66;H01L29/51;H01L21/02;H01L21/28;H01L29/739;H01L29/78;H01L29/10 |
主分类号 |
H01L31/0328 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A Tunnel Field-Effect Transistor (TFET) comprising:
a semiconductor substrate; a source region in the semiconductor substrate; a drain region in the semiconductor substrate, wherein the source region and the drain region are of opposite conductivity types; and a gate stack over the semiconductor substrate, with the source region and the drain region extending to opposite sides of the gate stack, wherein the gate stack comprises:
a gate dielectric over the semiconductor substrate, wherein the gate dielectric comprises a high-k dielectric material; anda ferroelectric layer over the gate dielectric, wherein the gate dielectric and the ferroelectric layer have a same composition, and the gate dielectric has an amorphous structure, and the ferroelectric layer has a crystalline structure; and a diffusion barrier overlying the high-k dielectric material and underlying the ferroelectric layer. |
地址 |
Hsin-Chu TW |