| 摘要 |
According to an embodiment of the present invention, a device of optically measuring a distributed defect in a three-dimensional environment comprises: a light source unit supplying light; a lighting unit which allows light emitted from the light source unit to enter to a display panel; a scan unit which sends a reflected light from a surface of the display panel and a reflected light from a surface of a depth Z to an expansion unit; the expansion unit which expands distance X, wherein the distance X is a distance between the reflected light from the surface of the display panel and the reflected light from the surface of the depth Z; a detection unit measuring the distance X; and a photographing unit positioned above the display panel to photograph the display panel. |
