发明名称 |
Methods for etching substrate and semiconductor devices |
摘要 |
A method of etching a substrate using a metal-assisted chemical etching process is provided. The method may include forming a metal catalytic layer to a predetermined thickness on a substrate and reacting the metal catalytic layer with the etching solution to form a porous surface in the metal catalytic layer and etch the substrate. When the metal catalytic layer is reacted with an etching solution, a porous surface may be formed on the metal catalytic layer. |
申请公布号 |
US9437441(B2) |
申请公布日期 |
2016.09.06 |
申请号 |
US201514835513 |
申请日期 |
2015.08.25 |
申请人 |
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY |
发明人 |
Oh Jungwoo;Song Yunwon;Ki Bugeun;Choi Keorock |
分类号 |
H01L21/311;H01L21/461;H01L29/06;H01L21/306 |
主分类号 |
H01L21/311 |
代理机构 |
Procopio, Cory, Hargreaves & Savitch LLP |
代理人 |
Procopio, Cory, Hargreaves & Savitch LLP |
主权项 |
1. A method of etching a substrate using a metal-assisted chemical etching process, the method comprising:
forming a metal catalytic layer to have a thickness greater than 3 nm and less than 10 nm on a substrate; and reacting the metal catalytic layer with the etching solution to form a porous surface in the metal catalytic layer and etch the substrate, wherein a plurality of pin holes of the porous surface are formed in the metal catalytic layer, the plurality of pin holes being formed by the reaction with the etching solution, and wherein the pin holes are formed in the metal catalytic layer to have a density of 1-300 ea/μm2. |
地址 |
Seoul KR |