发明名称 Methods and optical interrogation system for monitoring structural health of a structure
摘要 Methods and an optical interrogation system for monitoring structural health of a structure are provided. The method includes generating an optical signal using an optical signal generator, and directing the optical signal towards at least one optical sensor located remotely from the optical signal generator. The optical sensor includes a photonic crystal wafer optically interacting with the optical signal and an environmental condition. The method also includes capturing, by an optical signal receiving apparatus, a reflected optical signal reflected from the at least one optical sensor, and analyzing the reflected optical signal to determine a change in the environmental condition.
申请公布号 US9459513(B2) 申请公布日期 2016.10.04
申请号 US201514819532 申请日期 2015.08.06
申请人 THE BOEING COMPANY 发明人 Carralero Michael A.;Larsen Ty A.
分类号 G02B6/12;G02F1/295;A61B5/00;G01N21/55;G01D5/26;G01N21/47;G01B9/02;G02B6/122 主分类号 G02B6/12
代理机构 Armstrong Teasdale LLP 代理人 Armstrong Teasdale LLP
主权项 1. A method of monitoring structural health of a structure using an optical interrogation system, comprising: generating an optical signal using an optical signal generator; directing the optical signal towards at least one optical sensor located remotely from the optical signal generator, the optical sensor including a photonic crystal wafer optically interacting with the optical signal and an environmental condition, the optical sensor further including a fiber optic strand, wherein the photonic crystal wafer is attached directly against a terminating end surface of a core of the fiber optic strand; capturing, by an optical signal receiving apparatus, a reflected optical signal reflected from the at least one optical sensor; analyzing the reflected optical signal to determine a change in the environmental condition; applying a range of voltages to the photonic crystal wafer to change reflectance properties of the photonic crystal wafer; and using the photonic crystal wafer as a low-power communications device by modifying light reflectance that is readable by an optical interrogator.
地址 Chicago IL US