| 摘要 |
PROBLEM TO BE SOLVED: To provide an imaging condition optimization method and an imaging condition optimization system that eliminate the need for operator'high skill and that are able to reduce the number of pieces of misinformation without automatically updating an inspection standard.SOLUTION: An image condition optimization method comprises: a data accumulation step in which inspection image data D1 to D3 are generated from the image data D1 to D3 of electronic components P1 to P6 by using image conditions, the generated inspection image data D1 to D3 are compared with a predetermined inspection reference, and misinformation image data D1 to D3, which are image data D1 to D3 of the electronic components P1 to P6 in which misinformation arose, are accumulated in a case where the electronic components P1 to P6 are rejected in inspection even though the electronic components P1 to P6 are satisfactory; and an optimum imaging condition acquisition step in which, in a case where the accumulated misinformation image data D1 to D3 exceed a predetermined threshold value, the acquisition of the optimum imaging conditions that decrease misinformation is attempted using the accumulated misinformation image data D1 to D3. |
