发明名称 Acrylic polymer and radiation-sensitive resin composition
摘要 To provide a resist which is excellent in the solubility in a resist solvent and little dependent on baking temperature and can form developed patterns reduced in line edge roughness. An acrylic polymer characterized by comprising units of the general formula (1), units of general formula (2), and units of general formula (3) and/or units of general formula (4), wherein R, R′, R″and R′″are each hydrogen, methyl, or trifluoromethyl; R1 is hydrogen, C1-4 linear or branched alkyl, alkoxy, or C1-4 linear or branched fluoroalkyl; X is a C7-20 polycyclic aliphatic hydrocarbon group consisting of carbon atoms and hydrogen atoms; R2 and R3 are each independently C1-4 linear or branched alkyl; R4 is a C4-20 alicyclic hydrocarbon group; R5 is C1-4 linear or branched alkyl; and R6 and R7 are each hydrogen or C1-4 linear or branched alkyl.
申请公布号 US7704669(B2) 申请公布日期 2010.04.27
申请号 US20040567117 申请日期 2004.08.04
申请人 JSR CORPORATION 发明人 FUJIWARA KOUICHI;YAMAGUCHI HIROSHI;NAKAMURA ATSUSHI
分类号 G03F7/004;C08F220/18;C08F220/30;C08F224/00;G03F7/039 主分类号 G03F7/004
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