| 摘要 |
A device for determining the state of a magnetic element includes an emitter constructed and adapted to emit a charged particle beam; a bi-state magnetic cell disposed on a path of the particle beam, whereby the particle beam is deflected along a first deflection path when the cell is in a first magnetic state, and the particle beam is deflected along a second deflection path, distinct from the first deflection path, when the cell is in a second magnetic state. At least one ultra-small resonant structure positioned on the deflection paths.
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